发明名称 TRENCH ISOLATION METHOD OF A SEMICONDUCTOR DEVICE
摘要 PURPOSE: A trench isolation method of a semiconductor device is provided to guarantee a sufficient active region by intensifying an insulating characteristic of a trench isolation, and to prevent a defect such as a porousness by thermally processing an insulating layer in a trench. CONSTITUTION: A trench for isolating devices is formed in a predetermined region of a semiconductor substrate. After an insulating layer for device isolation is filled in the trench, impurities having the same conductivity type as that of the semiconductor substrate are injected into the trench filled with the insulating layer to improve an insulating characteristic of the device isolation.
申请公布号 KR20000075099(A) 申请公布日期 2000.12.15
申请号 KR19990019482 申请日期 1999.05.28
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 KIM, BONG HYEON;PARK, DONG CHEOL;LEE, JONG O
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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