发明名称 SEMICONDUCTOR DEVICE AND METHOD OF PRODUCTING THE SAME
摘要 A semiconductor device of the present invention and using trench isolation includes contact holes. Spacers are formed on the shoulder portions of a device region exposed in the contact holes. To form the spacers, a silicon oxide film is formed and then etched by anisotropic etching such that the film does not fill up the contact holes. The anisotropic etching may be effected after oxidation. With this structure, it is possible to prevent junction leakage current from increasing. <IMAGE>
申请公布号 KR100273861(B1) 申请公布日期 2000.12.15
申请号 KR19970049022 申请日期 1997.09.26
申请人 NEC CORPORATION 发明人 ABIKO, HITOSHI;SAKAI, ISAMI
分类号 H01L21/28;H01L21/76;H01L21/768;H01L23/522;H01L29/417;(IPC1-7):H01L21/76 主分类号 H01L21/28
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