发明名称 ALIGN KEY FOR FORMING A CAPACITOR
摘要 PURPOSE: An align key for forming a capacitor is provided to prevent a seam caused by a defective step coverage of an oxidation layer and to prevent the seam from being lifted after a cleaning process, by having the align key include a dot pattern and line patterns. CONSTITUTION: An alignment key for forming a capacitor includes a plurality of dot patterns. The plurality dot patterns are disposed to have a line shape, and the line-shaped dot patterns are arranged to have a box shape. The width of each dot pattern is of the scope from 0.3 to 0.5 micrometer.
申请公布号 KR20000075236(A) 申请公布日期 2000.12.15
申请号 KR19990019741 申请日期 1999.05.31
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 BAEK, IN GI
分类号 H01L23/58;(IPC1-7):H01L23/58 主分类号 H01L23/58
代理机构 代理人
主权项
地址