发明名称 |
TRENCH ISOLATING METHOD OF A NON VOLATILE MEMORY DEVICE |
摘要 |
PURPOSE: A trench isolating method of a non volatile memory device is provided to prevent a lateral surface of a conductive layer for a floating gate from being oxidized in an oxidizing process for forming an oxidation layer on an inner wall of a trench, by forming an oxidation stop layer while the conductive layer and mask layer are patterned so as to form the trench. CONSTITUTION: A pad oxidation layer(22) is formed on a semiconductor substrate(20). A conductive layer(24) is formed on the pad oxidation layer. A mask layer(26) is formed on the conductive layer. The mask layer and conductive layer in a non-active region are etched away. An oxidation stop layer(30) is formed on the entire surface of the resultant structure. A trench is formed in the non-active region of the semiconductor substrate. An oxidation layer is formed on an inner wall of the trench. The trench is filled with an insulating material.
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申请公布号 |
KR20000074729(A) |
申请公布日期 |
2000.12.15 |
申请号 |
KR19990018862 |
申请日期 |
1999.05.25 |
申请人 |
SAMSUNG ELECTRONICS CO, LTD. |
发明人 |
HONG, SEOK HUN |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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