发明名称 TRENCH ISOLATING METHOD OF A NON VOLATILE MEMORY DEVICE
摘要 PURPOSE: A trench isolating method of a non volatile memory device is provided to prevent a lateral surface of a conductive layer for a floating gate from being oxidized in an oxidizing process for forming an oxidation layer on an inner wall of a trench, by forming an oxidation stop layer while the conductive layer and mask layer are patterned so as to form the trench. CONSTITUTION: A pad oxidation layer(22) is formed on a semiconductor substrate(20). A conductive layer(24) is formed on the pad oxidation layer. A mask layer(26) is formed on the conductive layer. The mask layer and conductive layer in a non-active region are etched away. An oxidation stop layer(30) is formed on the entire surface of the resultant structure. A trench is formed in the non-active region of the semiconductor substrate. An oxidation layer is formed on an inner wall of the trench. The trench is filled with an insulating material.
申请公布号 KR20000074729(A) 申请公布日期 2000.12.15
申请号 KR19990018862 申请日期 1999.05.25
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 HONG, SEOK HUN
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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