| 摘要 |
<p>A system and method for testing the quality of a simulation model for the DUT (device under test) through temporal coverage of the testing and verification process (10). Temporal coverage (25) examines the behavior of selected variables over time, according to a triggering event. Such a triggering event could be determined according to predefined sampling times and/or according to the behavior of another variable, for example. This information is collected during the testing/verification process (24), and is then analyzed in order to determine the behavior of these variables (26), as well as the quality of the simulation model for the DUT. For example, the temporal coverage information can be analyzed to search for a coverage hole, indicated by the absence of a particular value from a family of values.</p> |
