发明名称 LOW TEMPERATURE SACRIFICIAL OXIDE FORMATION
摘要 A method for depositing a sacrificial oxide for fabricating a semiconductor device includes preparing p-doped silicon regions (306) on a semiconductor wafer (300) for depositing a sacrificial oxide (302) on the p-doped silicon regions (306). The method also includes the step of placing the wafer in an electrochemical cell (100) such that a solution (312) including electrolytes interacts with the p-doped silicon regions to form a sacrificial oxide (302) on the p-doped silicon regions when a potential difference is provided between the wafer (300) and the solution (312). Processing the wafer using the sacrificial oxide layer is also included.
申请公布号 WO0075977(A1) 申请公布日期 2000.12.14
申请号 WO2000US12900 申请日期 2000.05.11
申请人 INFINEON TECHNOLOGIES NORTH AMERICA CORP. 发明人 MICHAELIS, ALEXANDER;KUDELKA, STEPHAN
分类号 H01L21/316;H01L21/8242;H01L27/108 主分类号 H01L21/316
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