发明名称 |
LOW TEMPERATURE SACRIFICIAL OXIDE FORMATION |
摘要 |
A method for depositing a sacrificial oxide for fabricating a semiconductor device includes preparing p-doped silicon regions (306) on a semiconductor wafer (300) for depositing a sacrificial oxide (302) on the p-doped silicon regions (306). The method also includes the step of placing the wafer in an electrochemical cell (100) such that a solution (312) including electrolytes interacts with the p-doped silicon regions to form a sacrificial oxide (302) on the p-doped silicon regions when a potential difference is provided between the wafer (300) and the solution (312). Processing the wafer using the sacrificial oxide layer is also included. |
申请公布号 |
WO0075977(A1) |
申请公布日期 |
2000.12.14 |
申请号 |
WO2000US12900 |
申请日期 |
2000.05.11 |
申请人 |
INFINEON TECHNOLOGIES NORTH AMERICA CORP. |
发明人 |
MICHAELIS, ALEXANDER;KUDELKA, STEPHAN |
分类号 |
H01L21/316;H01L21/8242;H01L27/108 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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