| 摘要 |
<p>A soft program method for an integrated circuit (105), applied to successive subject bit lines and providing efficient convergence of over-erased floating gate memory cells on bit lines, includes a BLISP method. The BLISP method is adapted for low current consumption compared to bulk soft programming method. The soft program is applied to conforming selected bit lines and redundant bit lines which replace defective bit lines. The defective bit lines in first memory array (110) can be disabled during the soft program and replaced by corresponding redundant bit lines disposed in second memory array (170), so that the soft program is not applied to the defective bit lines. By preventing application of the soft program to the defective bit lines, the BLISP method avoids consumption of excessive current that would otherwise be consumed by very low threshold voltage memory cells disposed on the defective bit lines. The excessive current would render the soft program method much less efficient.</p> |
