APPARATUS FOR DETECTING FOREIGN MATTER IN RAW MATERIAL AND METHOD OF DETECTING THE SAME

摘要

In an apparatus for and method of detecting a foreign matter in a raw material, plural specified wavelength components of infrared ray or ultraviolet ray are irradiated toward a raw material (T) on a conveyer (2), reflection intensities of the specified wavelength components reflected from the raw material (T) are measured, the measured reflection intensities are compared with reflection intensities of the specified wavelength components inherent to the raw material (T) and, on the basis of the comparison result, the foreign matter is detected.