发明名称 METAL OXIDE SEMICONDUCTOR TRANSISTOR OF A CHARGE COUPLED DEVICE SENSE AMPLIFIER
摘要 PURPOSE: A metal oxide semiconductor(MOS) transistor of a charge coupled device(CCD) sense amplifier is provided to improve a transconductance characteristic and to prevent a short channel effect, by forming a gate oxidation layer and an insulating layer over a source/drain which have different thickness. CONSTITUTION: A metal oxide semiconductor(MOS) transistor of a charge coupled device(CCD) sense amplifier comprises a substrate(1), a high density source/drain(3,2), a gate oxidation layer, a stack of the first oxidation layer(4), a nitride layer(5) and the second oxidation layer(6) and a gate electrode(7). The high-density source/drain is positioned in a predetermined depth from the surface of the substrate, separated from each other. The gate oxidation layer is positioned on the high-density source/drain and the substrate between the high-density source and drain. The stack of the first oxidation layer, nitride layer and second oxidation layer is formed on the gate oxidation layer over the high-density source/drain. The gate electrode is positioned on the gate oxidation layer in the stack structure.
申请公布号 KR20000074704(A) 申请公布日期 2000.12.15
申请号 KR19990018828 申请日期 1999.05.25
申请人 HYUNDAI MICRO ELECTRONICS CO.,LTD. 发明人 SIM, JIN SEOP;LEE, SEO GYU
分类号 H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/78
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