发明名称 |
RESIST MASK AND ITS FORMATION |
摘要 |
PROBLEM TO BE SOLVED: To easily obtain a coating film having high uniformity and to manufacture a high precision mask by forming a resist film from plural resist layers and controlling the thickness of each of the resist layers. SOLUTION: A mask substrate 1 comprises quartz glass 2 and a light shielding film 3 laminated on the glass 2. A resist film 4 is formed on the mask substrate 1 by laminating 1st to 3rd resist layers 4a-4c. The resist film 4 is formed from the plural resist layers 4a-4c and the thickness of each of the resist layers 4a-4c is controlled. Since unevenness in the thickness of a resist film by a rotary cup system is caused in the drying of an applied resist and is in proportion to the thickness of a coating film, the unevenness can be reduced by dividedly applying the resist. |
申请公布号 |
JP2000347382(A) |
申请公布日期 |
2000.12.15 |
申请号 |
JP19990155513 |
申请日期 |
1999.06.02 |
申请人 |
SEMICONDUCTOR LEADING EDGE TECHNOLOGIES INC |
发明人 |
HIRUTA KOJI |
分类号 |
B05D1/32;G03F1/54;G03F7/16;H01L21/027 |
主分类号 |
B05D1/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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