发明名称 Fabrication method for a dual damascene comprising an air-gap
摘要 A fabrication method for a dual damascene structure comprising an air-gap is provided. The method includes forming sequentially a first dielectric layer, a stop layer and a second dielectric layer on a substrate comprising a first metal layer. The first and the second dielectric layers are then defined to form a via. opening exposing the first metal layer and an opening in a predetermined position on the first and second dielectric layers. An oxide layer is then formed on the second dielectric layer covering the opening and forming a gap. The oxide layer and the second dielectric layer are then defined to form a trench, which exposes the first metal layer. A second metal layer and a via plug are then formed in the trench and the via. opening, wherein the second metal layer and the first metal layer are electrically connected through the via plug.
申请公布号 US6159840(A) 申请公布日期 2000.12.12
申请号 US19990439930 申请日期 1999.11.12
申请人 UNITED SEMICONDUCTOR CORP.;UNITED MICROELECTRONICS CORP. 发明人 WANG, JYH-MING
分类号 H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/768
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