发明名称 Exposure system and method of manufacturing device
摘要 A projection optic system exposes a substrate with exposing radiation through a mask pattern. An exposure system comprises calibration means for calibrating the image-forming characteristic of the projection optic system, means for setting the calibration time interval of the image-forming characteristic based on exposure conditions, and means for controlling the calibration means based on the calibration time interval set by the setting means.
申请公布号 AU4778400(A) 申请公布日期 2000.12.12
申请号 AU20000047784 申请日期 2000.05.19
申请人 NIKON CORPORATION 发明人 TAKAKAZU MUTO;MASAMI SEKI
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
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