| 摘要 |
An apparatus for providing a probing interface for a circuit under test exhibits a relatively narrow profile and a vertical orientation so that it does not block access to connectors in adjacent slots. The vertical orientation is made possible by the use of a circuit material comprising alternate sections of flexible material and rigid material. Advantageously, the signal lines between the circuit card under test and its motherboard are direct and relatively short, and the probing connection points are isolated from the direct signal lines by a plurality of isolation resistors. The probing adapter includes the capability of monitoring the bus of the system under test and disassembling monitored AGP codes.
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