发明名称 SIDEWALL REMOVING LIQUID
摘要 PROBLEM TO BE SOLVED: To provide a sidewall removing liquid which is capable of rapidly (within 60 minutes) removing the sidewalls generated at the time of dry etching in a semiconductor production stage at a low temperature (<=150 deg.C) and is not capable of eroding a wiring material at this time. SOLUTION: The sidewall removing liquid is an aqueous solution of nitric acid and sulfuric acid and/or phosphoric acid and the nitric acid concentration thereof is 0.01 to 50 wt.% and the sulfuric acid and/or phosphoric acid concentration is 0.001 to 30 wt.%. The method for formation of resist patterns includes a stage of washing the sidewalls generated at the time of the dry etching in the semiconductor production stage by any one of the sidewall removing liquids described above.
申请公布号 JP2000338686(A) 申请公布日期 2000.12.08
申请号 JP19990150032 申请日期 1999.05.28
申请人 SHOWA DENKO KK 发明人 OGATA FUJIMARO;SUGIYAMA TSUTOMU;MIYAHARA KUNIAKI
分类号 H01L21/302;G03F7/42;H01L21/027;H01L21/3065;H01L21/308;(IPC1-7):G03F7/42;H01L21/306 主分类号 H01L21/302
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