发明名称 |
SIDEWALL REMOVING LIQUID |
摘要 |
PROBLEM TO BE SOLVED: To provide a sidewall removing liquid which is capable of rapidly (within 60 minutes) removing the sidewalls generated at the time of dry etching in a semiconductor production stage at a low temperature (<=150 deg.C) and is not capable of eroding a wiring material at this time. SOLUTION: The sidewall removing liquid is an aqueous solution of nitric acid and sulfuric acid and/or phosphoric acid and the nitric acid concentration thereof is 0.01 to 50 wt.% and the sulfuric acid and/or phosphoric acid concentration is 0.001 to 30 wt.%. The method for formation of resist patterns includes a stage of washing the sidewalls generated at the time of the dry etching in the semiconductor production stage by any one of the sidewall removing liquids described above.
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申请公布号 |
JP2000338686(A) |
申请公布日期 |
2000.12.08 |
申请号 |
JP19990150032 |
申请日期 |
1999.05.28 |
申请人 |
SHOWA DENKO KK |
发明人 |
OGATA FUJIMARO;SUGIYAMA TSUTOMU;MIYAHARA KUNIAKI |
分类号 |
H01L21/302;G03F7/42;H01L21/027;H01L21/3065;H01L21/308;(IPC1-7):G03F7/42;H01L21/306 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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