发明名称 DEVICE AND METHOD FOR MEASURING SURFACE DENSITY
摘要 PROBLEM TO BE SOLVED: To easily measure the surface density of a specific layer in a foil-shaped object for displaying without destroying the foil-shaped object consisting of a plurality of substance layers, by equipping a primary measurement part being used as a base for obtaining the surface density of a substance layer, a reference surface density measurement part, an surface density operation part, and the like. SOLUTION: A device 100 is composed by a primary measurement part 110, a reference surface density measurement part 120, a surface density operation part 130, and the like. The primary measurement part 110 obtains a primary measurement value being used as a base for obtaining the surface density of a foil-shaped object to be measured. The reference surface density measurement part 120 measures the surface density being used as a reference according to, for example, a foil-shaped sample being cut by certain area as a sample. The surface density operation part 130 is equipped with surface density correction parameter-leading part 131 being connected to the primary measurement part 110 and the reference surface density measurement part 120, a surface density correction parameter record 132 being connected to the parameter-leading part 131, and a base part primary measurement record 133 and a base/application part primary measurement value record 134 being connected to the primary measurement part 110.
申请公布号 JP2000338023(A) 申请公布日期 2000.12.08
申请号 JP19990145512 申请日期 1999.05.25
申请人 SONY CORP 发明人 SAKABE NORIAKI;SEKIYA SHUICHI;MURATA MAMORU;IMAIZUMI KAZUHIRO
分类号 G01N9/00;(IPC1-7):G01N9/00 主分类号 G01N9/00
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