| 摘要 |
PROBLEM TO BE SOLVED: To test a system LSI by causing internal operations having high test effects in the LSI. SOLUTION: A system LSI for verifying a device is constituted of an optical disk control system LSI 101, incorporating a microcomputer 110 and an evaluation device 120 which tests the LSI 101. A test pattern discriminating section 125 tests the LSI 101, by adjusting the test data and test pattern given to the LSI 101 or the giving timing of the data and pattern, by obtaining the information on the interruption of the microcomputer and the information of the multiplicity of the execution of a hard block constituting the LSI 101. |
