| 摘要 |
PROBLEM TO BE SOLVED: To realize a method for ultrasonic inspection capable of accurately measuring the length or flaw inspection. SOLUTION: A pulse-like transversal wave 4 having a vibrating direction coincident with a crystal growing direction ([001] direction) of a material 1 to be inspected is incident from one side 3 of a surface 2 to be inspected. In this case, the wave 4 is incident perpendicularly to a surface of the material 1. The wave 4 incident to the material 1 is propagated through the material 1, and arrives at another side 5 of the surface 2. The wave 4 arriving at the side 5 of the surface 2 is reflected at the side 5, propagated toward one side 3 of the incident position, and arrives at the one side 3 incident with the wave 4. Accordingly, a propagating time from when the wave 4 is incident from the one side 3 of the surface 2 to when the wave 4 is arrived at the one side 3 is measured, thereby measuring a thickness (=propagating time ×propagating speed) of the surface 2. |
