发明名称 SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To increase the response speed of feedback control in a Z-direction and to prevent the variation of the irradiation position of laser beam accompanying the scanning in an XY direction. SOLUTION: The probe 3 arranged in opposed relation to a sample S, a Z-direction scanner (5) driven in a Z-direction, an XY-direction scanner 4 performing scanning in an XY direction and a measuring head 2 for detecting the displacement of the probe are provided and the probe 3 is attached to the Z-direction scanner (5) and a laser beam emitting part 21 equipped with the measuring head 2 is arranged between the Z-direction scanner (5) and the XY- direction scanner 4. By driving only the probe 3 in the Z-direction, the response speed of the feedback control in the Z-direction is increased and, by making the irradiation position of laser beam on the probe 3 regardless of the scanning in the XY-direction, erroneous-detection is prevented.
申请公布号 JP2000338028(A) 申请公布日期 2000.12.08
申请号 JP19990144886 申请日期 1999.05.25
申请人 SHIMADZU CORP 发明人 ITO TAKESHI
分类号 G01B7/34;G01B21/30;G01N37/00;G01Q10/04;G01Q60/24;G01Q90/00;(IPC1-7):G01N13/16 主分类号 G01B7/34
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