| 摘要 |
PROBLEM TO BE SOLVED: To prevent decrease in reliability due to volume changes in an adhesive layer by irradiation with light and to prevent deterioration in the display quality. SOLUTION: A first sealing material 52a having a first glass transition temp. and a second sealing material 52b having a second glass transition temp. lower than the first glass transition temp. are disposed in the sealing region 202 for the gap between a thin film transistor(TFT) array substrate 10 and a counter substrate using a microlens array. Thereby, stress generating in the counter substrate, TFT array substrate 10 or the like due to changes in the adhesive resin layer on the counter substrate with time by irradiation with light or the like can be effectively decreased. |
