发明名称 |
TEST TERMINAL FOR PRINTED CIRCUIT BOARD, AND METHOD FOR TESTING PRINTED CIRCUIT BOARD |
摘要 |
PROBLEM TO BE SOLVED: To easily test a printed circuit board by relatively simple constitution. SOLUTION: This method is a method for conducting a test changing a test land 6 to a test terminal 20 in the case of conducting the test while making a probe 13 contact with the test land 6 formed in a wiring pattern 2 of a printed circuit board 1, a test land part 21 of the test terminal 20 is bonded to the printed circuit board 1 with an adhesive member 23, a tip part of a flexible lead wire part 22 extended from the test land part 21 is connected solderedly to the test land 6, and the probe 13 is brought into contact with the test land part 21 to conduct the test. The lead wire part 22 of the test terminal 20 is directly connected also to an electrode part of an electronic component 4 of the printed circuit board 1 without being limited to the test land 6.
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申请公布号 |
JP2000338192(A) |
申请公布日期 |
2000.12.08 |
申请号 |
JP19990150726 |
申请日期 |
1999.05.28 |
申请人 |
NEC CORP |
发明人 |
SAITOU TATSUMI;FUKUSHIMA MASAHIKO |
分类号 |
H05K3/00;G01R1/06;G01R31/02;G01R31/28;(IPC1-7):G01R31/28 |
主分类号 |
H05K3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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