发明名称 SECONDARY CHARGED PARTICLE IMAGE PROJECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a secondary charged particle image projection device having a small distortion aberration in the wide-field observation even when existing an ExB as a beam separator. SOLUTION: In this device, a prestage image projection optical system is constituted making a group of two prestage lenses 3 and 4 as a center and these lenses 3 and 4 constitute a telecentric system on both sides. Thereby, as shown in a solid line, a main light ray becomes parallel to the optical axis in the first prestage lens 3 and does not become divergent, thus incident on a point near the optical axis of a projection lens 7 compared with a conventional technique. Therefore, even when under the wide-field and low magnification, a bobbin-like distortion aberration is suppressed from generating and the light ray to be used is close to the paraxial ray so that other aberrations can be suppressed smaller.
申请公布号 JP2000340162(A) 申请公布日期 2000.12.08
申请号 JP19990145938 申请日期 1999.05.26
申请人 NIKON CORP 发明人 TAKAGI TORU
分类号 H01J37/04;H01J37/153;H01J37/29;(IPC1-7):H01J37/29 主分类号 H01J37/04
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