| 摘要 |
PROBLEM TO BE SOLVED: To provide a searching method used for various purposes capable of carrying out automatically defect search in a short time with simple constitution without using detail circuit information, in the case of carrying out the defect search for specifying a function-defective or production-defective portion of a mounting board mounted with an IC and an electronic component. SOLUTION: This searching method for searching a defect of a mounting board has a first process S1 for measuring signals of the wlole nets or selected nets of a nondefective board and a defective board to store results thereof, a second process S2 for specifying a signal of a direction setting terminal based on a logical state of a direction control terminal, a third process S3 for comparing measured results of both boards to extract defect propagating nets of the defective board, and a fourth process S4 for extracting an original defective net out of the defect propagating nets based on input and output attributes of the terminal.
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