发明名称 METHOD FOR TESTING SEMICONDUCTIVE ENDLESS PLASTIC BELT
摘要 PROBLEM TO BE SOLVED: To shorten a measuring time for an electric resistance value, and to enhance evaluation precision for uniformness of the resistance value. SOLUTION: A voltage is impressed between both positive and negative electrodes fixed onto an insulation block 30 to measure a current flowing in a semi-conductive endless plastic belt B between the both electrodes, while the belt B is kept under running, in a condition that the both electrodes fixed onto the insulation block 30 are brought into contact with an inner face of of the semiconductive endless belt B, and an electric resistance value of the belt B between both electrodes is calculated thereby.
申请公布号 JP2000338158(A) 申请公布日期 2000.12.08
申请号 JP19990153975 申请日期 1999.06.01
申请人 TOKAI RUBBER IND LTD 发明人 TOYAMA KAZUNORI;YASUI EIJI
分类号 G01R27/02;G01N27/04;G01R31/00;G03G15/16;(IPC1-7):G01R31/00 主分类号 G01R27/02
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