发明名称 X-RAY ELEMENT-MAPPING DEVICE FOR CYLINDRICAL SAMPLE
摘要 PROBLEM TO BE SOLVED: To obtain an X-ray element-mapping device that can easily and accurately map a cylindrical sample. SOLUTION: An X-ray element-mapping device D is equipped with a sample stage 1 for placing a sample, an X-ray tube 2 for applying X rays to the sample, and an X-ray detector 3 for detecting a fluorescent X rays being generated in the sample by applying the X rays. In this case, a cylindrical sample S is rotatably retained around the axis center on the sample stage 1, and the sample stage 1 is freely moved in the axis center direction of at least the cylindrical sample S.
申请公布号 JP2000338064(A) 申请公布日期 2000.12.08
申请号 JP19990153476 申请日期 1999.06.01
申请人 HORIBA LTD;RICOH CO LTD 发明人 MIZUTA MASAO;KADOTA YASUSHI;HOKEN ICHIRO
分类号 G01N23/223;(IPC1-7):G01N23/223 主分类号 G01N23/223
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