发明名称 PACKAGE FOR HIGH POWER MICROELECTRONICS
摘要 A package (20) for housing one or more semiconductor devices (22A; 22B) has a base (24) formed of a copper alloy having a fully annealed tensile strength in excess of 40 ksi (276MPa) at room temperature. The package includes a stainless steel ring (34) brazed atop the base with a brazing material having a melting point in excess of 700 DEG C. The combination of the ring and the base at least partially defines a cavity (60) for containing the semiconductor device(s). The cavity has a length and a width each in excess of 2.5 cm.
申请公布号 WO0074453(A1) 申请公布日期 2000.12.07
申请号 WO2000US14821 申请日期 2000.05.25
申请人 OLIN AEGIS 发明人 STRUCK, STEPHEN, W.;TOWER, STEVEN, A.
分类号 H01L23/047;H01L23/06;H01L23/10;(IPC1-7):H05K5/06 主分类号 H01L23/047
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