发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND MANUFACTURING APPARATUS |
摘要 |
In the step of embedding a wiring in a semiconductor device utilizing a damascene process, the dielectric constant of an insulating film is not increased. Therefore the manufacturing process is simplified. In the step of forming a protective film on a metal layer in the damascene process, a cleaning unit for removing particles adhering to a polished wafer is combined with a processing unit for bringing into contact an organic material, for example, a benzotriazole solution adhering to the metal layer of the wafer from which the particles are removed. The combination of the processing unit and the cleaning unit can be a batch type or single wafer type.
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申请公布号 |
WO0074128(A1) |
申请公布日期 |
2000.12.07 |
申请号 |
WO2000JP03544 |
申请日期 |
2000.06.01 |
申请人 |
TOKYO ELECTRON LIMITED;NIUYA, TAKAYUKI;ONO, MICHIHIRO;GOTO, HIDETO |
发明人 |
NIUYA, TAKAYUKI;ONO, MICHIHIRO;GOTO, HIDETO |
分类号 |
H01L21/00;H01L21/02;H01L21/306;H01L21/321;H01L21/768;(IPC1-7):H01L21/320;H01L21/304 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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