SINGLE EVENT UPSET (SEU) HARDENED STATIC RANDOM ACCESS MEMORY CELL

摘要

A single event upset hardened memory cell to be utilized in static random access memories is disclosed. The single event upset hardened memory cell includes a first set of cross-coupled transistors, a second set of cross-coupled transistors, a first set of isolation transistors, and a second set of isolation transistors. The first and second sets of isolation transistors are coupled to the first and second sets of cross-coupled transistors, respectively, such that two inversion paths are formed between the cross-coupled transistors and the isolation transistors.