发明名称 |
METHOD FOR FORMING METAL INTERCONNECTION LAYER OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a metal interconnection of a semiconductor device is provided to form a plug without a planarization process, by depositing an anti-seed layer on an interlayer dielectric except the inside of a contact hole or via to selectively form a metal layer. CONSTITUTION: An interlayer dielectric(210) is formed on a semiconductor substrate(200) having a conductive pattern. An anti-seed layer(220) is formed on the interlayer dielectric. A contact hole is formed in a predetermined region of the interlayer dielectric and the anti-seed layer to expose the substrate by a photolithography process. A metal layer is selectively formed only on the interlayer dielectric inside the contact hole to form a planarized plug.
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申请公布号 |
KR100272660(B1) |
申请公布日期 |
2000.12.01 |
申请号 |
KR19970030372 |
申请日期 |
1997.06.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
PARK, HYUN;KO, CHEOL KI |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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