发明名称 |
METHOD FOR FORMING PLUG OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a plug of a semiconductor device is provided to reduce contact resistance of metal by minimizing loss of a poly plug in a contact hole, and to improve process margin by improving margin regarding an etch-back process of a polysilicon layer in a unit process. CONSTITUTION: After an insulating layer(22) is formed on a semiconductor substrate(21), the insulating layer is selectively removed to form a contact hole exposing the semiconductor substrate. A polysilicon layer is formed on the entire surface including the contact hole, and a poly plug(24a) is formed in the contact hole by an etch-back process using mixed etching gas of SF6 and HBr. Metal is formed on the entire surface of the semiconductor substrate including the poly plug.
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申请公布号 |
KR100268935(B1) |
申请公布日期 |
2000.12.01 |
申请号 |
KR19970070057 |
申请日期 |
1997.12.17 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KIM, IL SEOP |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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