发明名称 METHOD FOR FORMING PLUG OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a plug of a semiconductor device is provided to reduce contact resistance of metal by minimizing loss of a poly plug in a contact hole, and to improve process margin by improving margin regarding an etch-back process of a polysilicon layer in a unit process. CONSTITUTION: After an insulating layer(22) is formed on a semiconductor substrate(21), the insulating layer is selectively removed to form a contact hole exposing the semiconductor substrate. A polysilicon layer is formed on the entire surface including the contact hole, and a poly plug(24a) is formed in the contact hole by an etch-back process using mixed etching gas of SF6 and HBr. Metal is formed on the entire surface of the semiconductor substrate including the poly plug.
申请公布号 KR100268935(B1) 申请公布日期 2000.12.01
申请号 KR19970070057 申请日期 1997.12.17
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 KIM, IL SEOP
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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