发明名称 SELF-EXCIATION AND SELF-DETECTION-TYPE PROBE AND SCANNING PROBE DEVICE
摘要 PROBLEM TO BE SOLVED: To obtain a self-detection-type probe which is of a self-excitation type and which can perform a measurement with high accuracy and to obtain a scanning probe device which uses the probe. SOLUTION: In this scanning probe device, the lever 3 of a probe 1 is vibrated, and a sample is measured. A resistor 5 is installed at the lever 3, a periodic bias signal is applied to the resistor 5, the lever 3 is vibrated without being excited from the outside and the displacement of the lever 3 can be detected on the basis of a change, in the resistance of the resistor 5 which is generated at this time.
申请公布号 JP2000329681(A) 申请公布日期 2000.11.30
申请号 JP20000019217 申请日期 2000.01.27
申请人 SEIKO INSTRUMENTS INC 发明人 SHIMIZU NOBUHIRO;SHIRAKAWABE YOSHIHARU;TAKAHASHI HIROSHI;YASUMURO CHIAKI;ARAI TADASHI
分类号 G01B21/30;G01B7/34;G01Q20/04;G01Q60/32;G01Q60/38;(IPC1-7):G01N13/16 主分类号 G01B21/30
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