发明名称 EXPOSURE SYSTEM AND METHOD OF MANUFACTURING DEVICE
摘要 A projection optic system exposes a substrate with exposing radiation through a mask pattern. An exposure system comprises calibration means for calibrating the image-forming characteristic of the projection optic system, means for setting the calibration time interval of the image-forming characteristic based on exposure conditions, and means for controlling the calibration means based on the calibration time interval set by the setting means.
申请公布号 WO0072365(A1) 申请公布日期 2000.11.30
申请号 WO2000JP03218 申请日期 2000.05.19
申请人 NIKON CORPORATION;MUTO, TAKAKAZU;SEKI, MASAMI 发明人 MUTO, TAKAKAZU;SEKI, MASAMI
分类号 G03F7/20;(IPC1-7):H01L21/027 主分类号 G03F7/20
代理机构 代理人
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