| 摘要 |
PROBLEM TO BE SOLVED: To prevent an oversight in a test of error caused by improper contact in a circuit device for a burn-in test of a semiconductor module including a memory circuit provided with a connection terminal allowing a burn-in test signal of a burn-in test device having active/inactive conditions to be applied. SOLUTION: This memory circuit 1 is constituted in such a way that a memory element 2 is arranged in a burn-in test signal connection terminal A, an input side of the memory element is connected with the terminal A to store a burn-in test signal, the memory element is manufactured in such a way that it has an active condition when an active signal is applied on an input side E, the memory element is connected with a functional unit 3, and this output signal Q has a first condition when all the memory elements have active conditions and has a second condition when at least one memory element has an inactive condition.
|
