发明名称 PRECISION PRESSURE MONITOR
摘要 During operation of a FTICR MS the time after the opening of the pulsed valve sample gas inlet system that the peak of sample gas pressure occurs in the vacuum chamber is determined by measuring the amplitude of the ion pump current. The FTICR MS then uses that time and the known period of time for which a source of electrons used for an ionization event is energized to energize the electron source so that the known period of time includes the peak of vacuum chamber sample gas pressure. This allows ions to be created during the peak of the sample gas pressure to thereby obtain the maximum sensitivity during measurements.
申请公布号 WO0024032(A3) 申请公布日期 2000.11.30
申请号 WO1999US23500 申请日期 1999.10.13
申请人 SIEMENS APPLIED AUTOMATION, INC. 发明人 LITTLEJOHN, DUANE, P.;ARNOLD, ROBERT, W.
分类号 H01J41/10;H01J49/38;(IPC1-7):H01J41/06;H01J49/42 主分类号 H01J41/10
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