发明名称 SEMICONDUCTOR DEVICE AND TEST METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To conduct tests of built-in DA converter and AD converter without using a test device for analog test. SOLUTION: An attenuator 9 attenuates an output signal of a DA converter 2A and a level shifter 10A changes a direct current level of an output signal of the DA converter 2A and supplies it to an AD converter 3A through an analog switch 8. Consequently, even if a width of change of an output signal of the DA converter and direct current level and a width of change of the AD converter and direct current level differ from each other and resolutions of the DA converter and AD converter differ from each other, they are matched to conduct a test, and an expensive test device for analog test is not necessary at all.
申请公布号 JP2000329829(A) 申请公布日期 2000.11.30
申请号 JP19990135745 申请日期 1999.05.17
申请人 NEC IC MICROCOMPUT SYST LTD 发明人 OKIDO TOSHIO
分类号 G01R31/316;G01R31/28;H03M1/10;H03M1/18;(IPC1-7):G01R31/316 主分类号 G01R31/316
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