发明名称 Automatic location determination of devices under test
摘要 A test device for a computer system includes a burn rack having a plurality of workcells. A simple network management protocol switch device is provided adjacent the burn rack. The switch device includes a plurality of ports. A plurality of cables are provided such that a respective cable interconnects a respective port of the switch device and a respective workcell. A monitor is provided adjacent the burn rack and is connected to a port of the switch device. At least one of the workcells has a computer mounted therein provided with a unique Mac Address and connected to the respective cable at the respective workcell. The monitor is connected to a burn rack database.
申请公布号 IE990514(A1) 申请公布日期 2000.11.29
申请号 IE19990000514 申请日期 1999.06.18
申请人 DELL USA, L.P. 发明人 ROGER WONG;SUBHASHINI RAJAN
分类号 G06F11/24;G01R31/00;G01R31/26;G06F11/22;G06F11/273;(IPC1-7):G06F11/00;G06F17/60;G06F153:00 主分类号 G06F11/24
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