发明名称 Mätsystem
摘要 A measuring signal (lambda1) is generated and brought towards the sensor (8) of measuring system and a reference signal (lambda2) is generated and transmitted through optical connector (4), connecting sensor and measuring device, without being influenced by the sensor. Both the signals are detected and correction data for bending compensation is obtained based on pre-stored data concerning the relationship between the two measured signals as a function of the bending influence upon optical connector. Independent claims are also included for the following: (a) Device for measurements in optical measuring system; (b) Measurement system for physical parameter influencing a sensor element
申请公布号 SE0004374(D0) 申请公布日期 2000.11.28
申请号 SE20000004374 申请日期 2000.11.28
申请人 SAMBA SENSORS AB 发明人 NEVIO *VIDOVIC;MARTIN *KRANZ;SVANTE *HOEJER
分类号 G01D5/26;G01L;G01L11/02;(IPC1-7):G01L/ 主分类号 G01D5/26
代理机构 代理人
主权项
地址