发明名称 OPERATION CONTROL METHOD OF PLANT BY NEAR INFRARED ANALYSIS
摘要 PROBLEM TO BE SOLVED: To replenish a calibration curve without any waste and at the same time appropriately control a plant based on an analyzed measurement value by comparing a measurement value according to a near infrared analysis with the measurement value of a general analysis method periodically for replenishing the calibration curve. SOLUTION: A plant 1 manufactures a product from a raw material 2 according to a control signal 4a of a control device 4 and sends a detection signal 1a to the control device 4. A near-infrared analysis device (NIR) 5 receiving a control signal 4b from the control device 4 at a constant interval performs sampling from the plant 1 for a near-infrared analysis and sends a measurement signal 5a to the control device 4. The control device 4 calculates a measurement value from an already created calibration curve and controls the manufacturing conditions of the plant 1 according to the control signal 4a based on the operation result. In this case, a control signal 4c is sent to a general analysis device 6 periodically, the measurement value is compared with the measurement value of the near-infrared analysis device 5. Then, if there is any difference exceeding a set value, the calibration curve is replenished and the plant 1 is controlled appropriately by the measurement value of the replenished calibration curve.
申请公布号 JP2000321201(A) 申请公布日期 2000.11.24
申请号 JP19990131965 申请日期 1999.05.12
申请人 MITSUI CHEMICALS INC 发明人 MITANI TOSHIHARU;MIYOSHI YASUO;TSURUOKA MASAMI
分类号 G01N21/27;C07B61/00;(IPC1-7):G01N21/27 主分类号 G01N21/27
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