| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing device having a light source device of high accuracy in the test of electric characteristic of a semiconductor photoelectric converting element. SOLUTION: A liquid crystal panel device 2 is mounted on or closely contacted with a semiconductor photoelectric converting element 1 with the proper distance and position. The liquid crystal panel device 2 is electrically connected to a semiconductor testing device 3 with the semiconductor photoelectric element 1. The semiconductor testing device 3 controls the liquid crystal panel device 2, determines the necessary quantity of light and wavelength, and tests the electric characteristic of the semiconductor photoelectric converting element 1 every time.
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