| 摘要 |
PROBLEM TO BE SOLVED: To accurately execute an operation test in an integrated circuit including an asynchronous circuit part with a simple configuration. SOLUTION: This scan test circuit 100 has a D-type flip-flop 102, a selector 104 for switching an operation mode, a delay circuit 106 inserted along a scan path 110, and a delay circuit 108 inserted along a clock path 112. The selector 104 switches data input between a normal operation and a scan operation on the basis of a mode select signal. That is, the selector 104 inputs normal data in the normal operation, while inputting a testing scan signal in the scan operation. |
