发明名称 FOCUSED ION BEAM DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent adhesion of a solid of a gasification material onto a target. SOLUTION: This focused ion beam device has a means for imperfectly blocking up a gas flow within a gas inlet pipe 7. For example, the gas inlet pipe 7 is once branched into three pipes in a portion of the midstream of the gas inlet pipe 7 and is newly joined into one pipe, while the three-branch portion is provided with a branch plate 12 for branching the gas flow into the two- branch portion on both the sides and newly allowing them to merge into the one pipe. Thereby, even if a solid of a gasification material is present within a gasification material storage part 6 and/or the gas inlet pipe 7 without sublimating (gasifying), the solid of the gasification material collides with the branch plate 12 to adhere to the branch plate 12.
申请公布号 JP2000323085(A) 申请公布日期 2000.11.24
申请号 JP19990133571 申请日期 1999.05.14
申请人 JEOL LTD 发明人 SAKAGAMI YOSHIHIRO
分类号 H01J37/317;C23C14/32;(IPC1-7):H01J37/317 主分类号 H01J37/317
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