| 摘要 |
PROBLEM TO BE SOLVED: To provide a solid-state image pickup unit capable of precisely measuring the characteristic of an AD converter and reducing a time for a test. SOLUTION: The device is provided with a pixel area 4 obtained by arranging a pixel cell on a semiconductor chip 1 in the state of an array, a vertical shift register 5 for selecting each pixel cell in the area 4, vertical signal lines 18-1 to 18-n for reading the signal of the selected pixel cell, and an AD converter 7 for AD-converting the signal read to the lines 18-1 to 18-n. Then a test signal inputting circuit 22 for inputting a test signal V TEST for testing the AD converter 7 into the AD converter 7 through the lines 18-1 to 18-n is provided.
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