| 摘要 |
PROBLEM TO BE SOLVED: To test a CR oscillation circuit by measuring characteristics of plural elements constituting the CR oscillation circuit. SOLUTION: This test method is provided with first and second terminals CL1 and CL2 to which outer resistance and an outer capacitor are connected, a first output buffer 11 connected to the first terminal CL1, a second output buffer 19 connected to the second terminal CL2, a delay circuit 20 for delaying the output of the first output buffer 11, a gate circuit 21 for feeding back the output of the first output buffer 11 and the output of the delay circuit 20 to the first output buffer 11, and state setting circuits (a multiplexer circuit 28 and a three-state buffer circuit 33) for controlling the states of the output buffers 11 and 19 based on control signals S1-S4 inputted from outside. The states of the output buffers 11 and 19 are changed and set based on the control signals S1-S4 from outside, then the leak state, voltage level and change timing of voltage level in the first and second terminals CL1 and CL2 are measured to confirm the oscillation characteristic of the CR oscillation circuit 1.
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