发明名称 METHOD AND APPARATUS FOR AUTOMATICALLY ADJUSTING THE CONTOUR OF A WAFER CARRIER SURFACE
摘要 A method and apparatus is provided for holding a workpiece (111) in a carrier (100) parallel to a polishing pad (112) while pressing the workpiece (111) against the polishing pad (112) during a planarization process. The carrier's pressure plate (102) and/or backing film (103) are comprised of materials that allow the carrier (100) to adjust its local contours based on the removal rate of material from the workpiece (111) during the planarization process without the need for complicated mechanical devices. In addition, or alternatively, the retaining ring (105) may be comprised of materials that allow the retaining ring (105) to adjust its local contours due to the friction between the retaining ring (105) and the polishing pad (112) during the planarization process, thereby pre-loading and stretching the polishing pad (112) in an even and uniform manner resulting in a superior planarizaton process.
申请公布号 WO0069595(A2) 申请公布日期 2000.11.23
申请号 WO2000US13399 申请日期 2000.05.16
申请人 SPEEDFAM-IPEC CORPORATION 发明人 MELONI, MARK, A.
分类号 B24B41/06;B24B49/14;(IPC1-7):B24B/ 主分类号 B24B41/06
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