| 摘要 |
<p>An apparatus and method are disclosed for measuring the area density of a low density material sample. The system includes an x-ray emitter (12) which emits x-rays in the range of 3 kilovolts to 20 kilovolts and the x-rays pass through the sample (16). An imaging device (18) converts the x-rays which pass through the sample and in which the visible image has an intensity which varies as a function of the area density across the sample. A camera (22) produces an output signal representative of the intensity of the visible image across the sample while a computer processor (26) processes the signal from the camera after digitization to produce an analysis of the area density of the sample.</p> |
