发明名称 METHOD FOR PRODUCING AN OHMIC CONTACT
摘要 The invention relates to a method for producing a component with a substrate (1) consisting of SiC and comprising at least one ohmic contact (2) and at least one Schottky contact (4). According to this method, the component is heated to a temperature of over 1300 DEG C, at least for the growth of the epitaxial layer (3). In order to prevent the production of the ohmic contact from causing a deterioration of other structures on the component and to ensure that the ohmic contact is rendered insensitive vis-à-vis future process steps at high temperatures, first metal is applied to the substrate (1) for the ohmic contact (2) before the epitaxial layer (3) is grown.
申请公布号 WO0017919(A3) 申请公布日期 2000.11.16
申请号 WO1999DE02875 申请日期 1999.09.10
申请人 SICED ELECTRONICS DEVELOPMENT GMBH & CO. KG;RUPP, ROLAND;WIEDENHOFER, ARNO 发明人 RUPP, ROLAND;WIEDENHOFER, ARNO
分类号 H01L21/28;H01L21/04;H01L29/24;H01L29/43;H01L29/45;H01L29/47;H01L29/872;(IPC1-7):H01L21/285;H01L21/329 主分类号 H01L21/28
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