发明名称 |
METHOD FOR PRODUCING AN OHMIC CONTACT |
摘要 |
The invention relates to a method for producing a component with a substrate (1) consisting of SiC and comprising at least one ohmic contact (2) and at least one Schottky contact (4). According to this method, the component is heated to a temperature of over 1300 DEG C, at least for the growth of the epitaxial layer (3). In order to prevent the production of the ohmic contact from causing a deterioration of other structures on the component and to ensure that the ohmic contact is rendered insensitive vis-à-vis future process steps at high temperatures, first metal is applied to the substrate (1) for the ohmic contact (2) before the epitaxial layer (3) is grown.
|
申请公布号 |
WO0017919(A3) |
申请公布日期 |
2000.11.16 |
申请号 |
WO1999DE02875 |
申请日期 |
1999.09.10 |
申请人 |
SICED ELECTRONICS DEVELOPMENT GMBH & CO. KG;RUPP, ROLAND;WIEDENHOFER, ARNO |
发明人 |
RUPP, ROLAND;WIEDENHOFER, ARNO |
分类号 |
H01L21/28;H01L21/04;H01L29/24;H01L29/43;H01L29/45;H01L29/47;H01L29/872;(IPC1-7):H01L21/285;H01L21/329 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|