发明名称 |
METHOD OF FORMING A POLYCIDE GATE ELECTRODE OF A SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of making a polycide gate electrode is provided of prevent an anti-reflected layer from being lifted from a silicide film by improving coupling force between the silicide film and the anti-reflected layer. CONSTITUTION: A method of making a polycide gate electrode comprises forming a gate insulation film(2) on a silicon substrate(1) on which a field oxide film(100) is formed. A polysilicon film(3) is formed on the gate insulation film(2) by a diffusion process. A silicide film(4) is formed on the polysilicon film(3) by a chemical vapor deposition process. An anti-reflected layer(5) is formed on the silicide film(4) by performing a diffusion process to the substrate in diffusion equipment.
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申请公布号 |
KR20000066747(A) |
申请公布日期 |
2000.11.15 |
申请号 |
KR19990014056 |
申请日期 |
1999.04.20 |
申请人 |
SAMSUNG ELECTRONICS CO, LTD. |
发明人 |
MIN, BYEONG HO |
分类号 |
H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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