发明名称 METHOD OF FORMING A POLYCIDE GATE ELECTRODE OF A SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of making a polycide gate electrode is provided of prevent an anti-reflected layer from being lifted from a silicide film by improving coupling force between the silicide film and the anti-reflected layer. CONSTITUTION: A method of making a polycide gate electrode comprises forming a gate insulation film(2) on a silicon substrate(1) on which a field oxide film(100) is formed. A polysilicon film(3) is formed on the gate insulation film(2) by a diffusion process. A silicide film(4) is formed on the polysilicon film(3) by a chemical vapor deposition process. An anti-reflected layer(5) is formed on the silicide film(4) by performing a diffusion process to the substrate in diffusion equipment.
申请公布号 KR20000066747(A) 申请公布日期 2000.11.15
申请号 KR19990014056 申请日期 1999.04.20
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 MIN, BYEONG HO
分类号 H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/78
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