| 摘要 |
PURPOSE: A semiconductor memory device of a parallel test mode of sharing data bus line is provided to reduce the number of the global data bus lines, and reduce the chip size. CONSTITUTION: The semiconductor memory device of embodying a parallel test mode includes many cell array blocks(100a-100d), many spare compressing parts(700a,700b), data compressing part(600), and an output part. The spare compressing parts determine whether data signals of the two cell array blocks are equal to each other in a parallel test mode under the control of the parallel test mode enable signal, and outputs the result signal to the global data bus line. The data compressing parts determine whether the two global data bus lines are equal to each other, and outputs a result signal to the output part. The output part outputs an output signal of he data compressing part to a data output pin.
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