| 摘要 |
PURPOSE: A scan test device of an asynchronous system is provided to improve a system capacity by applying a scan test applied to a synchronous system to an asynchronous system. CONSTITUTION: A scan test device of an asynchronous system comprises a plurality combination block(411-413), a plurality of scan flipflop(421-424), and a control portion. The combination block is operated according to a current input value and an initial input value. The scan flipflop shifts a test vector at a data shift mode and outputs combination block data of a previous combination block to the next combination block at data capture mode. The control portion outputs each control signal for controlling the flipflop at a scan test. |
