发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device is provided to improve a high speed characteristic at a low voltage by forming an N-epitaxial layer to the height of the surface of an insulating layer existing in a lower part of a conductive layer for a floating base, and to improve a step coverage of a metal interconnection without an additional process by forming a plug in a contact hole. CONSTITUTION: A semiconductor device comprises a semiconductor substrate(31), an insulating layer and a semiconductor layer. The insulating layer is formed within the semiconductor substrate in a first region and consecutively on the semiconductor substrate. The semiconductor layer is formed on the semiconductor substrate in a second region to the height of the surface of the insulating layer.
申请公布号 KR20000065388(A) 申请公布日期 2000.11.15
申请号 KR19990011611 申请日期 1999.04.02
申请人 HYUNDAI MICRO ELECTRONICS CO.,LTD. 发明人 KIM, YONG CHAN
分类号 H01L21/28;H01L21/331;H01L29/732;(IPC1-7):H01L21/28 主分类号 H01L21/28
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