发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor device is provided to improve a high speed characteristic at a low voltage by forming an N-epitaxial layer to the height of the surface of an insulating layer existing in a lower part of a conductive layer for a floating base, and to improve a step coverage of a metal interconnection without an additional process by forming a plug in a contact hole. CONSTITUTION: A semiconductor device comprises a semiconductor substrate(31), an insulating layer and a semiconductor layer. The insulating layer is formed within the semiconductor substrate in a first region and consecutively on the semiconductor substrate. The semiconductor layer is formed on the semiconductor substrate in a second region to the height of the surface of the insulating layer.
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申请公布号 |
KR20000065388(A) |
申请公布日期 |
2000.11.15 |
申请号 |
KR19990011611 |
申请日期 |
1999.04.02 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO.,LTD. |
发明人 |
KIM, YONG CHAN |
分类号 |
H01L21/28;H01L21/331;H01L29/732;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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