发明名称 |
METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing semiconductor device is provided to create oxidation layer instead of forming halogen ion implantation layer. CONSTITUTION: A device separation area(209) is made on a semiconductor substrate(200). Between the device separation areas, a gate oxidation layer(201) and a gate electrode(202) is build. On the gate electrode(202), a protection film of gate electrode(202). The semiconductor substrate between the side wall spacer(204) and the device separation area(209) is etched and a trench(206) is produced. An oxidation layer is covered the semiconductor substrate(200) using CVD(Chemical Vapor Deposition). By etching the isolation layer anisotropically, a spacer(208) is generated for preventing punch-through. The trench(206) is filled up with a conductive material(208). The conductive material works as a source and a drain of transistor.
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申请公布号 |
KR20000065719(A) |
申请公布日期 |
2000.11.15 |
申请号 |
KR19990012334 |
申请日期 |
1999.04.08 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO.,LTD. |
发明人 |
LEE, SANG HO |
分类号 |
H01L21/334;H01L21/336;H01L21/8242;H01L29/06;H01L29/417;(IPC1-7):H01L21/334 |
主分类号 |
H01L21/334 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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